MarSurf M 400/Surface roughness measurement | Surface finish evaluation | Laboratory-grade inspection | Advanced texture analysis | Precision quality controlC
Category: Portable Roughness Measurement
Specifications
Kuala Lumpur | Selangor | Shah Alam | Klang | Petaling Jaya | Subang Jaya | Cyberjaya | Rawang | Kajang | Bangi | Port Klang | Pulau Indah | Johor Bahru | JB | Pasir Gudang | Pengerang | Kulai | Batu Pahat | Muar | Kluang | Melaka | Bukit Rambai | Sungai Udang | Masjid Tanah | Alor Gajah | Nilai | Seremban | Senawang | Ipoh | Taiping | Penang | George Town | Batu Kawan | Bayan Lepas | Bukit Mertajam | Perai | Kulim | Sungai Petani | Kuantan | Gebeng | Kemaman | Kuala Terengganu | Kota Bharu | Kuching | Bintulu | Miri | Sibu | Kota Kinabalu | Labuan | Brunei
Machining industry | Automotive manufacturing | Aerospace | Precision engineering | Industrial metrology
Roughness Measuring System | Surface Finish Measurement System | Laboratory Roughness Tester | Advanced Roughness Analysis System
Surface roughness measurement | Surface finish evaluation | Laboratory-grade inspection | Advanced texture analysis | Precision quality control
Stylus-based profilometry measurement | High-precision laboratory scanning method | Digital roughness analysis system | Multi-parameter surface evaluation | Contact surface profiling
Details
- The best of the “mobile” devices.
- Surface evaluations using skidless tracing are needed not only in the measuring room but more and more in the production area.
MarSurf M 400 / C. The best of the “mobile” devices
- Both in the measuring room and increasingly also in the production area, there is a need for surface evaluations requiring skidless tracing.
- This generally requires more highly skilled operators, more time and more adjustment work.
- Within the “mobile surface metrology” range, MarSurf M 400 provides the necessary range of functions, while at the same time being quick and easy to use.
Technical Data
| IP protection category | IP 40 |
| Positioning speed | 0.5; 1.0 |
| Measuring principle | Stylus method |
| Probe | BFW skidless system |
| Measuring range mm | +/- 250 µm (up to +/- 750 µm with 3x probe arm length) |
| Profile resolution | Measuring range +/- 250 µm: 8 nm Measuring range +/- 25 µm: 0.8 nm |
| Filter according to ISO/JIS | Gaussian filter as per ISO 11562 Filter as per ISO 13565 |
| Cutoff Ic according to ISO/JIS | 0,08 mm , 0,25 mm , 0,8 mm , 2,5 mm , automatical , variable |
| Number n of sampling length according to ISO/JIS | 1-5 |
| Contacting speeds | 0.2 mm/s; 1.0 mm/s |
| Stylus | 2 µm |
| Measuring force (N) | 0.75 mN |
| Weight drive unit | approx. 0.9 kg |
| Weight measuring instrument | approx. 1.0 kg |
| Surface parameters | Over 50 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085) |
Applications
Mechanical engineering
- Bearings, shafts, racks, valves
Automotive
- Steering, brake system, gearbox, crankshaft, camshaft, cylinder head, cylinder block, turbocharger
Steel industry
- Measurement of sheet metal surfaces
- Measurement of roller surface
Medicine
- Surface roughness measurement for hip and knee endoprostheses
Aerospace
- Turbine components
Datasheet
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